Private Identity Testing for High-Dimensional Distributions
Clément L. Canonne Affiliation: School of Computer Science, University of Sydney Gautam Kamath Affiliation: Cheriton School of Computer Science, University of Waterloo Audra McMillan Affiliation: Department of Computer Science, Boston University Affiliation: Khoury College of Computer Sciences, Northeastern University Jonathan Ullman Affiliation: Khoury College of Computer Sciences, Northeastern University Lydia Zakynthinou Affiliation: Khoury College of Computer Sciences, Northeastern University
Abstract
In this work we present novel differentially private identity (goodness-of-fit) testers for natural and widely studied classes of multivariate product distributions: product distributions over $\{\pm 1\}^{d}$ and Gaussians in $\mathbb{R}^{d}$ with known covariance. Our testers have improved sample complexity compared to those derived from previous techniques, and are the first testers whose sample complexity matches the order-optimal minimax sample complexity of $O(d^{1/2}/\alpha^{2})$ in many parameter regimes. We construct two types of testers, exhibiting tradeoffs between sample complexity and computational complexity. Finally, we provide a two-way reduction between testing a subclass of multivariate product distributions and testing univariate distributions, and thereby obtain upper and lower bounds for testing this subclass of product distributions.
原文 arXiv:1905.11947;中英对照 + 大白话阅读 https://aha.fim.ai/paper/1905.11947v3